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• Double side circuit boards

- FEATURES MANUFACTURE DOUBLE SIDE
- GENERAL TOLERANCES

In order to classify the printed circuits’ difficulty we use the following parameters:

- CLASS
Is the dimensional characteristics set of the different elements that compose the printed circuit board image.

- RING CHECK
Makes reference to the copper ring between the hole and its pad. This parameter will determine the difficulty of trim between the hole and the image of the circuit.

- TOLERANCES
Made reference to the tolerance level of the different processes and materials.

The total of these 3 concepts will define the manufacture difficulty and therefore the price of the circuit.


FEATURES MANUFACTURE DOUBLE SIDE


Last update: 19-06-2007
Units: Milimeters
[Display using MILS]

CLASS 3 CLASS 4 CLASS 5 CLASS 6 CLASS 7
Minimum plated hole View schema... 0,50 mm 0,30 mm 0,30 mm 0,20 mm 0,15 mm
Minimum non plated hole View schema... 0,60 mm 0,40 mm 0,40 mm 0,30 mm 0,25 mm
Aspect/Ratio View schema... 5 5 6 8 13
(maximum thickness 2 mm)
Outer layer minimum
conductor with/spacing.
(thickness copper foil.)
View schema... 0,30 mm (17 µ )
0,30 mm (35 µ )
0,35 mm ( 70 µ )
0,20 mm (17 µ )
0,20 mm (35 µ )
0,25 mm ( 70 µ )
0,150 mm (17 µ)
0,150 mm (35 µ)
0,200 mm (70 µ )
0,125 mm (17 µ)
0,150 mm (35 µ)
0,175 mm (70 µ )
0,100 mm (17 µ)
minimum annular ring
View schema... 0.22 mm 0.17 mm 0.13mm 0.10mm 0.075 mm

 

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GENERAL TOLERANCES


Last update: 14-11-2007
Units: Milimeters
[Display using MILS]

STANDARD SPECIAL
Conductor width in outer layer
(thickness copper foil)
View schema... ±25% (35-70 µm)
±20% (17 µm )
±15% (35-70 µm)
±10% (17 µm)
Conductor width in inner layers
(thickness copper foil)
View schema... ±25% (70 µm )
±20% (17-35 µm )
±15% (35-70 µm)
±10% (17 µm)
Plated hole diameter View schema... +0,10 mm / -0,05 mm
(or equivalent)
+0,10 mm / -0,0 mm
(or equivalent)
Unplated hole diameter View schema... +0,10 mm / -0,0 mm
(or equivalent)
±0,035 mm
(or equivalent)
Copper clearance for scoring View schema... Min. 1,0 mm. Min. 0,75 mm.
Scoring positional accuracy View schema... ±0,10 mm ±0,075 mm
Scoring remaining thickness View schema... ±0,15 mm
±0,075 mm
Outers dimensions View schema... ± 0,15 mm.
± 0,10 mm.
Thickness tolerance View schema... ±10 % ±5 %
Dielectric thickness View schema... ±10 % ±5 %
Plating thickness, copper, holes. View schema... Average: 25 µm
Minim: 20 µm
Average: 35 µm
Mínim: 30 µm
Plating thickness,
copper, buried vias
View schema... Average: 15 µm
Minim: 13 µm
Mitja: 25 µm
Mínim: 20 µm
Wall between neighbour Plated Holes View schema... 0,40 mm. 0,35 mm.
Wall between neighbour nonplated holes. View schema... 0,25 mm. 0,20 mm.
Wall between
neighbour nonplated holes.
View schema... 0,25 mm
0,20 mm
Minimum annular ring in nonplated holes View schema... 0,20 mm
0,15 mm
Conductor to boardedge
minimum spacing
View schema... 0,20 mm
0,15 mm
Drilling to outline misalignement View schema... Max. 0,15 mm.
Max. 0,10 mm.
Drill to pad misalingnement
(outerlayer)
View schema... Max. 0,10 mm.
Max. 0,075 mm.
Drill to pad misalignement
(innerlayer)
View schema... Max. 0,15 mm. Max. 0,12 mm.
Layer to layer misalignement View schema... Max. 0,10 mm.
Max. 0,075 mm.
Soldermask to pad
misalignement
View schema... Max. 0,15 mm. Max. 0,075 mm.
Soldermask minimum line
(SMT)
View schema... 0,10 mm
0,075 mm
Photoimageable soldermask clearance View schema... 0,10 mm
0,075 mm
Silkscreened soldermask clearance View schema... 0,20 mm
0,15 mm
Legend minimum line View schema... 0,15 mm
0,125 mm
Conductive ink (graphite) overlapping View schema... 0,20 mm
0,125 mm
Conductive ink (graphite) spacing View schema... 0,50 mm 0,40 mm
Conductive ink-pad spacing View schema... 0,40 mm 0,30 mm
Peel-off mask overlapping View schema... 1 mm
0,60 mm
Peel-off mask-pad spacing View schema... 0.5 mm 0,50 mm
Peel-off mask-board
edge spacing
View schema... 0.4 mm 0,40 mm
Maximum peel-off mask filled hole View schema... 2 mm 2 mm
Bow and twist spacer Maxim 1% Maxim 0,5 %
Insulation resistance spacer Minim 0,5 MOhm Minim 2,0 MOhm
Continuity spacer Maxim 10 Ohms -
Electrical strength spacer 750 V/mil (30 V/µm.)
segons MIL-13949 H
-
Ionic contamination spacer Max. 1µg Eq. CINa/cm2 Max. 0,8 µg Eq. CINa/cm2
For other features spacer See spec.
IPC-A-600 Rev.G jul-04
-

 

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